67.977516 a classifi block
62.87832 the system databas
81.603455 the same resolut
57.968822 the product design
67.26697 the process engin
82.273094 the inspect resolut
32.88208 the inspect gray scale signal i
47.02084 the full imag
52.61316 refer imag of the product
75.506195 product inspect data
42.852623 inspect system
91.40038 inspect imag
15.043819 inspect data
71.1758 imag resolut becaus the refer
32.723583 gray scale inspect imag
63.890854 entri into the defect memori
81.62765 each defect type
95.356026 an electron registr subsystem
62.585934 all parallel defect detect cha
29.202784 align the refer data
27.565933 accur represent
89.47134 abnorm between refer
10.245389 a separ channel
25.696146 a raster manner
9.867442 a defect memori
